Methods for Characterization of Protective Films on the Copper Surface - A Review
dc.citation.epage | 122 | |
dc.citation.issue | 2 | |
dc.citation.rank | M53 | |
dc.citation.spage | 111 | |
dc.citation.volume | 51 | |
dc.contributor.author | Radovanović, Milan | |
dc.contributor.author | Antonijević, Milan | |
dc.date.accessioned | 2023-12-25T22:04:54Z | |
dc.date.available | 2023-12-25T22:04:54Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0351-9465 | |
dc.identifier.uri | http://www.sitzam.org.rs/zm/2010/No2/ZM_51_2_111.pdf | |
dc.identifier.uri | https://repozitorijum.tfbor.bg.ac.rs/handle/123456789/1113 | |
dc.language.iso | en | |
dc.rights.license | ARR | |
dc.rights.uri | https://en.wikipedia.org/wiki/All_rights_reserved | |
dc.source | Zaštita materijala | |
dc.title | Methods for Characterization of Protective Films on the Copper Surface - A Review | |
dc.type | article | |
dc.type.version | publishedVersion |