Applying the Di®erent Statistical Tests in Analysis of Electrical Breakdown Mechanisms in Nitrogen Filled Gas Diode

Simple item page
dc.citation.epage986
dc.citation.issue10
dc.citation.rankM23
dc.citation.spage978
dc.citation.volume18
dc.contributor.authorMaluckov, Čedomir
dc.contributor.authorRančev, Saša
dc.contributor.authorMiodrag, Radović
dc.date.accessioned2023-12-25T21:02:39Z
dc.date.available2023-12-25T21:02:39Z
dc.date.issued2016
dc.identifier.doi10.1088/1009-0630/18/10/03
dc.identifier.urihttps://repozitorijum.tfbor.bg.ac.rs/handle/123456789/137
dc.language.isoen
dc.rights.licenseARR
dc.rights.urihttps://en.wikipedia.org/wiki/All_rights_reserved
dc.sourcePlasma Science and Technology
dc.titleApplying the Di®erent Statistical Tests in Analysis of Electrical Breakdown Mechanisms in Nitrogen Filled Gas Diode
dc.typearticle
dc.type.versionpublishedVersion

Files

Collections

Temporary