Characterization of the Cu-Ge-In: microstructural, mechanical, electrical properties, scheil and laver simulation

Thumbnail Image

Date

2025

Authors

Đorđević, Aleksandar
Zečević, MIlena
Minić, Duško
Kolarević, Milan
Balanović, Ljubiša
Manasijević, Dragan
Petrović, Milenko

Journal Title

Journal ISSN

Volume Title

Publisher

Polish Academy of Sciences

Source

Archives of Metallurgy and Materials

Volume

70

Issue

1

Abstract

Based on application of Cu-based alloys and special application of Ge-based alloys it is from huge interest to study properties of the Cu-Ge-X alloys. In this paper selected system is Cu-Ge-In. This system was previously studied by our group. In this paper results are focused on electrical and mechanical properties. Experimental tests were performed on 12 ternary alloys. Six different experimental techniques were used to test the ternary alloys. The microstructure was tested using light optical microscopy (LOM) and scanning electron microscopy (SEM). The composition of the phases and the composition of the alloys were examined by energy dispersive spectroscopy (EDS). X-ray diffractometric analysis (XRD) was used to determine the phases. Properties such as hardness and electrical conductivity tests were performed. Those properties were used for calculation and modeling those properties along all composition ranges. Isothermal section at 25°C were predicted. Calculated isothermal section and were compared with results of the EDS and XRD test. Good agreement of calculated and experimental result has been reached. Best results of electrical conductivity and hardness give alloys with composition Cu80.93Ge9.86In9.21.

Description

Keywords

Isothermal section at 25°C, mechanical and electrical properties, microstructure test, mathematical modeling

Citation

DOI

10.24425/amm.2025.152546

Scopus

ISSN

1733-3490
2300-1909

ISBN

License

CC-BY

Collections