Characterization of the Cu-Ge-In: microstructural, mechanical, electrical properties, scheil and laver simulation

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dc.citation.epage309
dc.citation.issue1
dc.citation.rankM23
dc.citation.spage299
dc.citation.volume70
dc.contributor.authorĐorđević, Aleksandar
dc.contributor.authorZečević, MIlena
dc.contributor.authorMinić, Duško
dc.contributor.authorKolarević, Milan
dc.contributor.authorBalanović, Ljubiša
dc.contributor.authorManasijević, Dragan
dc.contributor.authorPetrović, Milenko
dc.date.accessioned2025-05-08T09:27:03Z
dc.date.available2025-05-08T09:27:03Z
dc.date.issued2025
dc.description.abstractBased on application of Cu-based alloys and special application of Ge-based alloys it is from huge interest to study properties of the Cu-Ge-X alloys. In this paper selected system is Cu-Ge-In. This system was previously studied by our group. In this paper results are focused on electrical and mechanical properties. Experimental tests were performed on 12 ternary alloys. Six different experimental techniques were used to test the ternary alloys. The microstructure was tested using light optical microscopy (LOM) and scanning electron microscopy (SEM). The composition of the phases and the composition of the alloys were examined by energy dispersive spectroscopy (EDS). X-ray diffractometric analysis (XRD) was used to determine the phases. Properties such as hardness and electrical conductivity tests were performed. Those properties were used for calculation and modeling those properties along all composition ranges. Isothermal section at 25°C were predicted. Calculated isothermal section and were compared with results of the EDS and XRD test. Good agreement of calculated and experimental result has been reached. Best results of electrical conductivity and hardness give alloys with composition Cu80.93Ge9.86In9.21.
dc.identifier.doi10.24425/amm.2025.152546
dc.identifier.issn1733-3490
dc.identifier.issn2300-1909
dc.identifier.urihttps://repozitorijum.tfbor.bg.ac.rs/handle/123456789/5963
dc.language.isoen
dc.publisherPolish Academy of Sciences
dc.rights.licenseCC-BY
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceArchives of Metallurgy and Materials
dc.subjectIsothermal section at 25°C
dc.subjectmechanical and electrical properties
dc.subjectmicrostructure test
dc.subjectmathematical modeling
dc.titleCharacterization of the Cu-Ge-In: microstructural, mechanical, electrical properties, scheil and laver simulation
dc.typearticle
dc.type.versionpublishedVersion

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